Structured Illumination Microscopy (SIM)

Superresolution structured illumination (SR-SIM) is an advanced imaging technique to image fine structural details with minimal changes to standard immunofluorescence protocols using conventional dyes. The resulting image is of high quality with expected resolution of 120 nm lateral resolution (X,Y) and 300 nm axial resolution (Z). This technique uses five different grating frequencies to allow for optimal matching of illumination pattern to laser wavelength and objective lens used.

For more information about SR-SIM in our facility please contact:

Dr. Thomas Klonisch
Department Head
Head Office: 789-3893
Fax: 789-3920

130-745 Bannatyne Avenue
Winnipeg, MB  R3E 0J9
Basic Medical Services Building
Bannatyne Campus